The Scanning Very-Low-Energy Electron Microscope (SVLEEM)-Reference-Cited by-同舟云学术

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The Scanning Very-Low-Energy Electron Microscope (SVLEEM)

Published:1992 Issue: Volume: Page:173-177
ISSN:0076-8642
Container-title:Mikrochimica Acta
language:
Short-container-title:

Author:

Müllerová Ilona,Lenc Michal

Publisher

Springer Vienna

Link

http://link.springer.com/content/pdf/10.1007/978-3-7091-6679-6_16.pdf

Reference9 articles.

1. E. Bauer, in: Studies in Surface Science and Catalysis 36, J. Koukal, ed., Elsevier, Amsterdam, 1988, p.26.

2. W. Telieps, E. Bauer, Ultramicroscopy 1985, 17, 57.

3. M. Lenc, Čs. Čas. Fyz. 1975, A25, 28 (in Czech).

4. T. Ichinokawa, in: Proc. X11th ICXOM (S. Jasienska, L. J. Maksymowicz, eds.), Acad. Min. and Metallurgy, Cracow, 1989,25.

5. R. S. Paden, W. C. Nixon, J. Phys. E: Sci. Instr. 1968, 1, 1073.

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