1. A. Röseler, Infrared Spectroscopic Ellipsometry, Akademie-Verlag, Berlin, 1990.
2. M. Weidner, A. Röseler, M. Eichler, Thin Solid Films
1993, 234, 337.
3. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light, North-Holland, Amsterdam, 1977.