2-D Electrothermal Simulation and Failure Analysis of GTO Turn-off with Complete Chopper Circuit Parasitics-Reference-Cited by-同舟云学术

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2-D Electrothermal Simulation and Failure Analysis of GTO Turn-off with Complete Chopper Circuit Parasitics

Published:1993 Issue: Volume: Page:53-56
ISSN:
Container-title:Simulation of Semiconductor Devices and Processes
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Short-container-title:

Author:

Gerstenmaier Y. C.,Brunner H.

Publisher

Springer Vienna

Link

http://link.springer.com/content/pdf/10.1007/978-3-7091-6657-4_12.pdf

Reference8 articles.

1. Technology Modeling Associates. Inc. Palo Alto, California, USA, MEDICI user’s manual. March 1992.

2. M. Turowski, A. Napieralski, J.M. Dorkel, Proceedings EPE-MADEP Firenze 1991, p.0–363–0–368.

3. Y.C. Gerstenmaier, ISPS’92 Proceedings, 1992, Czech Technical University in Prague, p.49.

4. I. Omura and A. Nakagawa, Proceedings of 1992 International Symposium on Power Semiconductor Devices & ICs, Tokyo, pp.112–117.

5. H. Ohashi and A. Nakagawa, IEEE IEDM-81 Tech. Dig., p.414, 1981.

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of GTO Turn-on in an Inverter Circuit at Low Temperatures using 2-D Electrothermal Simulation;Simulation of Semiconductor Devices and Processes;1995

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