Model-based optical metrology and visualization of 3-D complex objects-Reference-Cited by-同舟云学术

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Model-based optical metrology and visualization of 3-D complex objects

Published:2007-03 Issue:2 Volume:3 Page:115-118
ISSN:1673-1905
Container-title:Optoelectronics Letters
language:en
Short-container-title:Optoelectron. Lett.

Author:

Liu Xiao-li,Li A-meng,Zhao Xiao-bo,Gao Peng-dong,Tian Jin-dong,Peng Xiang

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11801-007-7018-y.pdf

Reference16 articles.

1. F. Chen, G. M. Brown,and M. Song. Opt. Eng., 39 (2000), 10.

2. W. Osten, Opt. Eng., 39,(2000), 232.

3. F. Blais. Journal of Electronic Imaging,13(2004), 231.

4. X. Peng, Z. Zhang, and Hans J. Tiziani, Optik, 113(2002), 448

5. X. Peng, J. Tian, P. Zhang, L. Wei, W. Qiu, E. Li, and D. Zhang, Opt. Lett., 30(2005), 1965.

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1. Multisensor data fusion in dimensional metrology;CIRP Annals;2009

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