Author:
Hong Chul-Un,Kang Hyung-Sub,Kim Seong-Jong,Kang Sung-Jun,Kim Gi-Beum
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Mechanical Engineering
Reference5 articles.
1. Aoki, N., Kikutani, T., Oki, A., Hori, H. and Yamada, S., “Normal-super-normal double tunneling junction fabricated in a split-gate wire,” Superlattices and Microstructures, Vol. 22, No. 2, pp. 229–235, 1997.
2. Chaikool, P., Aketagawa, M. and Okuyama, E., “Direct Measurement of Spindle Motion Error Using a Regular Crystalline Lattice and a Scanning Tunneling Microscope,” Int. J. Precis. Eng. Manuf., Vol. 9, No. 4, pp. 11–15, 2008.
3. Miskovsky, N. M. and Tsong, T. T., “Field evaporation of gold in single- and double-electrode systems,” Phys. Rev. B, Vol. 46, No. 4, pp. 2640–2643, 1992.
4. Jeanneret, B., Gavilano, J. L., Racine, G. A., Leemann, Ch. and Martinoli, P., “Inductive conductance measurements in two-dimensional superconducting systems,” Appl. Phys. Lett., Vol. 55, No. 22, pp. 2336–2338, 1989.
5. Staufer, U., Scandella, L., Rudin, H., Guntherodt, H.-J. and Garcia, N., “Tailoring nanostructures with a scanning tunneling microscope,” J. Vac. Sci. Technol. B, Vol. 9, No. 2, pp. 1389–1393, 1991.
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献