Sophisticated equipment developed for growth and evaluation of perfection of nearly perfect crystals-Reference-Cited by-同舟云学术

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Sophisticated equipment developed for growth and evaluation of perfection of nearly perfect crystals

Published:1984-05 Issue:2 Volume:6 Page:129-149
ISSN:0250-4707
Container-title:Bulletin of Materials Science
language:en
Short-container-title:Bull. Mater. Sci.

Author:

Lal Krishan,Verma Ajit Ram

Publisher

Springer Science and Business Media LLC

Subject

Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF02743892.pdf

Reference45 articles.

1. Bardsley W, Hurle D T J and Mullin J B (eds) 1979Crystal growth: A tutorial approach (Amsterdam: North-Holland)

2. Barret C S 1945Trans. AIME 161 15

3. Batterman B W and Cole H 1964Rev. Mod. Phys. 36 681

4. Bonse U and Hart M 1965Appl. Phys. Lett. 7 238

5. Dederichs P H 1973J. Phys. F3 471

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1. Triple-axis diffractometry on GaN/Al2O3(001) and AlN/Al2O3(001) using a parabolically curved graded multilayer as analyzer;Il Nuovo Cimento D;1997-02

2. Comparative study of dielectric properties of K2ZnCl4 and K2Zn1-xFexCl4 in the vicinity of incommensurate-commensurate phase transition;Journal of Materials Science Letters;1997

3. High resolution X-ray diffraction studies of real structure of nearly perfect single crystals;Bulletin of Materials Science;1993-12

4. Growth of nearly perfect LiNbO3 single crystals;Materials Science and Engineering: B;1993-02

5. A high-resolution multiple-crystal multiple-reflection diffractometer;Journal of Applied Crystallography;1989-02-01

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