Effects of electron radiation on commercial power MOSFET with buck converter application

Author:

Abubakkar Sheik Fareed Ookar,Zabah Nor Farahidah,Abdullah Yusof,Fauzi Dhiyauddin Ahmad,Muridan Norasmahan,Hasbullah Nurul Fadzlin

Publisher

Springer Science and Business Media LLC

Subject

Nuclear Energy and Engineering,Nuclear and High Energy Physics

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Radiation-induced degradation of silicon carbide MOSFETs – A review;Materials Science and Engineering: B;2024-02

2. Comprehensive Study of MOSFET Degradation in Power Converters and Prognostic Failure Detection Using Physical Model;Journal of The Institution of Engineers (India): Series B;2022-11-01

3. Commercial P-Channel Power VDMOSFET as X-ray Dosimeter;Electronics;2022-03-16

4. Total-dose Effects on Power MOSFET in SEPIC Converter for Nanosatellite Applications;Recent Advances in Electrical & Electronic Engineering (Formerly Recent Patents on Electrical & Electronic Engineering);2020-09-22

5. A Study of Electrical Field Stress Issues in Commercial Power MOSFET for Harsh Environment Applications;Practical Examples of Energy Optimization Models;2020

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