Analyzing the transient effects of 60Co gamma rays in a CIS by Monte Carlo method-Reference-Cited by-同舟云学术

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Analyzing the transient effects of 60Co gamma rays in a CIS by Monte Carlo method

Published:2019-06-15 Issue:7 Volume:30 Page:
ISSN:1001-8042
Container-title:Nuclear Science and Techniques
language:en
Short-container-title:NUCL SCI TECH

Author:

Xue Yuan-Yuan,Wang Zu-Jun,Liu Min-Bo,Xu Rui,Ning Hao,Zhao Wen,He Bao-Ping,Yao Zhi-Bin,Sheng Jiang-Kun,Ma Wu-Ying,Dong Guan-Tao

Publisher

Springer Science and Business Media LLC

Subject

Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://link.springer.com/content/pdf/10.1007/s41365-019-0634-y.pdf

Reference16 articles.

1. V. Goiffon, M. Estribeau, P. Magnan, Overview of ionizing radiation effects in image sensors fabricated in a deep-submicrometer CMOS imaging technology. IEEE Trans. Electron Dev. 56, 2594–2601 (2009). https://doi.org/10.1109/ted.2009.2030623

2. F. Wang, M.Y. Wang, Y.F. Liu et al., Obtaining low energy γ dose with CMOS sensors. Nucl. Sci. Tech. 25, 060401 (2014). https://doi.org/10.13538/j.1001-8042/nst.25.060401

3. G.R. Hopkinson, Radiation effects in a CMOS active pixel sensor. IEEE Trans. Nucl. Sci. 47, 2480–2485 (2002). https://doi.org/10.1109/23.903796

4. G.R. Hopkinson, A. Mohammadzadeh, R. Harboe-Sorensen, Radiation effects on a radiation tolerant CMOS active pixel sensor. IEEE Trans. Nucl. Sci. 51, 2753–2762 (2004). https://doi.org/10.1109/TNS.2004.835108

5. V. Goiffon, P. Magnan, O. Saint-Pé et al., Ionization versus displacement damage effects in proton irradiated CMOS sensors manufactured in deep submicron process. Nucl. Instrum. Methods A 610, 225–229 (2009). https://doi.org/10.1016/j.nima.2009.05.078

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1. A Method for Restoring γ-Radiation Scene Images Based on Spatial Axial Gradient Discrimination;Electronics;2023-09-04

2. Instrument and method for measuring the dose rates in 60Co γ rays environment with a 2K×2K CMOS image sensor imaging system;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2020-10

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