Section topography-Reference-Cited by-同舟云学术

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Section topography

Published:1977 Issue: Volume: Page:145-189
ISSN:0303-4216
Container-title:Topics in Applied Physics
language:
Short-container-title:

Author:

Authier A.

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/3-540-08462-2_11.pdf

Reference117 articles.

1. W. Berg: Z. Naturwiss. 19, 391 (1931)

2. U.Bonse, M.Hart, J.B.Newkirk: Advan. X-Ray Anal. 10, 1 (1967)

3. A. Authier: Advan. X-Ray Anal. 10, 9 (1967)

4. A. R. Lang: Advan. X-Ray Anal. 10, 91 (1967)

5. A. R. Lang: In Modern Diffraction and Imaging Techniques in material Science, ed. by S. Amelinckx, R.Gevers, G. Remaut, J. van Landuyt (North Holland, Amsterdam 1970) p. 407

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray topographic study of the antiferroelectric phase transition and antiphase boundaries in copper formate tetrahydrate;Zeitschrift für Kristallographie - Crystalline Materials;2015-10-31

2. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06

3. Useful formulae;Dynamical Theory of X-Ray Diffraction;2003-11-06

4. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06

5. Preface;Dynamical Theory of X-Ray Diffraction;2003-11-06

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