Recovery of Specimen Information for Strongly Scattering Objects-Reference-Cited by-同舟云学术

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Recovery of Specimen Information for Strongly Scattering Objects

Published:1980 Issue: Volume: Page:35-87
ISSN:0342-6793
Container-title:Topics in Current Physics
language:
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Author:

Saxton W. O.

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-81381-8_2.pdf

Reference102 articles.

1. P.W. Hawkes: Electron Optics and Electron Microscopy ( Taylor and Francis, London 1972 )

2. D.L. Mi sell: J. Phys. D9 9 1849–1866 (1976)

3. D.L. Mi sei 1: In Advances in Optical and Electron Microscopy, ed. by V.E. Coss- lett, R.E. Barer, Vol. 7 ( Academic, London 1979 ) pp. 185–279

4. D.F. Lynch, A.F. Moodie, M.A. O’Keefe: Acta Cryst. AZI 9 300 - 307 (1975)

5. P. Goodman, A.F. Moodie: Acta Cryst. A30 9 280 - 290 (1974)

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Exit wave reconstruction at atomic resolution;Ultramicroscopy;2004-07

2. Scattering and Phase Contrast for Amorphous Specimens;Transmission Electron Microscopy;1993

3. The theory of super-resolution electron microscopy via Wigner-distribution deconvolution;Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences;1992-06-15

4. Discussions on the multiple-input maximum a-posteriori wave-function restoration method in high-resolution electron microscopy;Journal of Electron Microscopy Technique;1991-03

5. Scattering and Phase Contrast for Amorphous Specimens;Transmission Electron Microscopy;1989

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