Author:
Brodal Gerth Stølting,Jørgensen Allan Grønlund,Moruz Gabriel,Mølhave Thomas
Publisher
Springer Berlin Heidelberg
Reference27 articles.
1. Finocchi, I., Italiano, G.F.: Sorting and searching in the presence of memory faults (without redundancy). In: Proc. 36th Annual ACM Symposium on Theory of Computing, pp. 101–110 (2004)
2. Constantinescu, C.: Trends and challenges in VLSI circuit reliability. IEEE micro 23(4), 14–19 (2003)
3. Tezzaron Semiconductor: Soft errors in electronic memory - a white paper (2004), http://www.tezzaron.com/about/papers/papers.html
4. Baumann, R.: Soft errors in advanced computer systems. IEEE Design and Test of Computers 22(3), 258–266 (2005)
5. Taber, A., Normand, E.: Single event upset in avionics. IEEE Transactions on Nuclear Science 40(2), 120–126 (1993)
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