Publisher
Springer Berlin Heidelberg
Reference47 articles.
1. Pozsgai P. et al., “SYSLEB: A Tool for the Calculation of the System Reliability from raw Failure Data”, Proc. Ann. Rel. & Maint. Symp., 2002, pp. 542–49.
2. Kossow A. et al., “Failure probability of strict consecutive-k-out-of-n: F systems”, IEEE Trans. Rel., 36(1987)5, pp. 551–53; “Rel. of consecutive-k-out-of-n: F systems with nonidentical component rel.”, IEEE Trans. Rel., 38(1989), pp. 229–33; “Mean time to failure for linear-consec.-k-out-of-n: F systems”, IEEE Trans. Rel., 40(1991)3, pp. 271–72; “Rel. of linear consecutive connected systems with multistate comp.”, IEEE Trans. Rel., 44(1995)3, pp. 518–22.
3. Bansal V.K., “Minimal path-sets and minimal cut-sets using search techniques”, Microel. & Rel., 22(1982)6, pp. 1067–1075.
4. Keymeulen D. et al., “Fault-tolerant evolvable hardware using field-programmable transistor arrays”, IEEE Trans. Rel., 49(2000)3, pp. 306–16.
5. Reynolds F., “Thermally Accelerated Aging of Semic. Comp.”, Proc. IEEE., 62(1974)2, pp. 212-22.