1. Lecture Notes in Artificial Intelligence;S. Veeramachaneni,2005
2. Devijver, P.A.: Relationship between statistical risk and the least-mean-square error criterion in pattern recognition. In: Proceedings of the First International Joint Conference on Pattern Recognition, Washington, DC (1973)
3. Devijver, P.A.: On a new class of bounds on Bayes risk in multihypothesis pattern recognition. IEEE Trans. on Computers C-23(1), 70–80 (1974)
4. Devijver, P.A., Kittler, J.: Pattern recognition: A statistical approach. Prentice/Hall (1982)
5. Devijver, P.A., Ronse, C.: Connected Components in Binary Images: The Detection Problem. John Wiley & Sons, Inc., New York (1984)