Zuverlässigkeit von Sensoren-Reference-Cited by-同舟云学术

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Zuverlässigkeit von Sensoren

Published:2014 Issue: Volume: Page:395-430
ISSN:2512-5281
Container-title:Sensortechnik
language:
Short-container-title:

Author:

Wilde Jürgen

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-29942-1_8

Reference25 articles.

1. AEC, Automotive Electronics Council. Q 100 – Stress-Test-Driven Qualification of Integrated Circuits. http://www.aecouncil.com/AECDocuments.html

2. Beroulle V, Bertrand Y, Latorre L, Nouet P (2001) Test and testability of a monolithic MEMS for magnetic field sensing. J Electron Test 17:439–450

3. Birolini A (1997) Zuverlässigkeit von Geräten und Systemen, 4 Aufl. Springer: New York

4. Bogatin E (1997) Roadmaps of packaging technology. Integrated Circuit Engineering, Scottsdale

5. Charlot B, Mir S, Parrain F, Courtois B (2001) Generation of electrically induced stimuli for MEMS self-test. J Electron Test 17:459–470

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2. Sensortechnik;Handbuch Mensch-Roboter-Kollaboration;2019

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