1. G. Pacchioni, L. Skuja, D.L. Griscom (eds.), Defects inSiO
2
and Related Dielectrics: Science and Technology, NATO Science Series, Kluwer, Dordrecht, 2000)
2. L. Skuja, in Defects inSiO
2
and Related Dielectrics: Science and Technology, NATO Science Series II, vol. 2, ed. by G. Pacchioni, L. Skuja, D.L. Griscom. Optical Properties of Defects in Silica (Kluwer, Dordrecht, 2000), pp. 73–116
3. L. Skuja, T. Suzuki, K. Tanimura, Site-selective laser-spectroscopy studies of the intrinsic 1.9-eV luminescence center in glassy SiO2. Phys. Rev. B: Condens. Matter 52(21), 15208–15216 (1995)
4. L. Skuja, The origin of the intrinsic 1.9 eV luminescence band in glassy SiO2. J. Non-Cryst. Solids 179, 51–69 (1994)
5. L. Skuja, K. Tanimura, N. Itoh, Correlation between the radiation-induced intrinsic 4.8 eV optical absorption and 1.9 eV photoluminescence bands in glassy SiO2. J. Appl. Phys. 80(6), 3518–3525 (1996)