An Application of White Light Profilometry Using Geometric Phase Shifting

Author:

Baldi Antonio,Bertolino Filippo,Ginesu Francesco,Lera Mario

Publisher

Springer Berlin Heidelberg

Reference8 articles.

1. Maitreyee Roy, P. Hariharan: White-light geometric phase interferometer for surface profiling. Interferometry VII: Techniques and Analysis, M. Kuijawinska, R. J. Pryputniwicz, Mitsuo Takeda (Eds.), SPIE Proc. 2544, 64-72 (1995)

2. R.C. Jones: A new calculus for the treatment of optical systems. I. Description and design of the calculus. J. Opt. Soc. Am31, 488-503 (1941)

3. D.W. Robinson: Phase unwrapping methods.Interferogram analysis: Digital Fringe Pattern Measurement Techniques (D.W. Robinson and G.T. Reid Eds., Institute of Physic Publishing, Bristol and Philadelphia, 135-140, 1993)

4. Eiolf Vikhagen: Non-destructive testing by use of the TV holography and deformation phase gradient calculation. Appl. Opt.29, 137-144 (1990)

5. William H. Press, Saul A. Teukolsky, William T. Vetterling, and Brian P. Flannery:Numerical Recipes in C (2nd ed. Cambridge University Press 1992)

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