Quantitative Strain Analysis With Image Shearing Speckle Pattern Interferometry-Reference-Cited by-同舟云学术

Quantitative Strain Analysis With Image Shearing Speckle Pattern Interferometry

Published:2000 Issue: Volume: Page:319-326
ISSN:
Container-title:Interferometry in Speckle Light
language:
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Author:

Waldner Stephan,Goudemand Nicolas

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-57323-1_40

Reference12 articles.

1. S. Waldner: Quantitative Strain Measurement with Image-Shearing Speckle Pattern Interferometry (Shearography), Diss. Techn. Wiss. ETH Zurich, No 13469(2000)

2. M. Lehmann: Statistical theory of two-wave speckle interferometry and its application to the optimization of deformation measurements, Thèse, Sciences techniques, EPF Lausanne, No 1797(1998)

3. H. A. Aebischer, S. Waldner: A simple and effective method for filtering speckle-interferometric phase fringe patterns. Optics Communications 162, 205-210 (1999)

4. S. Waldner: Removing the Image-Doubling in Shearography by Reconstruction of the Displacement Field. Optics Communications 127, 117-126, (1996)

5. S. Waldner: Removing the Image-Doubling in Shearography - Theory and Application, SPIE Proc. 2944, 247-254 (1996)

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