Author:
Giessibl Franz J.,Sugawara Yasuhiro,Morita Seizo,Hosoi Hirotaka,Sueoka Kazuhisa,Mukasa Koichi,Sasahara Akira,Onishi Hiroshi
Publisher
Springer Berlin Heidelberg
Reference131 articles.
1. G. Binnig: Atomic force microscope, method for imaging surfaces with atomic resolution, US Patent 4724318 (1986)
2. G. Binnig, C.F. Quate, C. Gerber: Atomic force microscope, Phys. Rev. Lett. 56, 930–933 (1986)
3. G. Binnig, H. Rohrer, C. Gerber, E. Weibel: Surface studies by scanning tunneling microscopy, Phys. Rev. Lett. 49, 57–61 (1982)
4. G. Binnig, H. Rohrer: The scanning tunneling microscope, Sci. Am. 253, 50–56 (1985)
5. G. Binnig, H. Rohrer: In touch with atoms, Rev. Mod. Phys. 71, S320–S330 (1999)
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