General and Special Probes in Scanning Microscopies-Reference-Cited by-同舟云学术

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General and Special Probes in Scanning Microscopies

Published:2011 Issue: Volume: Page:111-134
ISSN:
Container-title:Nanotribology and Nanomechanics I
language:
Short-container-title:

Author:

Hafner Jason,Chen Edin,Lal Ratnesh,Jin Sungho

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-15283-2_3

Reference51 articles.

1. R. Linnemann, T. Gotszalk, I.W. Rangelow, P. Dumania, E. Oesterschulze, Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers. J. Vac. Sci. Technol. B 14(2), 856–860 (1996).

2. T.R. Albrecht, S. Akamine, T.E. Carver, C.F. Quate, Microfabrication of cantilever styli for the atomic force microscope. J. Vac. Sci. Technol. A 8(4), 3386–3396 (1990).

3. O. Wolter, T. Bayer, J. Greschner, Micromachined silicon sensors for scanning force microscopy. J. Vac. Sci. Technol. B 9(2), 1353–1357 (1991).

4. C. Bustamante, D. Keller, Scanning force microscopy in biology. Phys. Today 48(12), 32–38 (1995).

5. J. Vesenka, S. Manne, R. Giberson, T. Marsh, E. Henderson, Colloidal gold particles as an incompressible atomic force microscope imaging standard for assessing the compressibility of biomolecules. Biophys. J. 65, 992–997 (1993).

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