Measurement of Photo Capacitance in Amorphous Silicon Photodiodes
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Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-642-37291-9_59
Reference6 articles.
1. Sze, S.M., Ng, K.K.: Physics of Semiconductor Devices, 3rd edn. John Wiley & Sons, Inc. (2007)
2. Hegedus, S.S., Fagen, E.A.: Characterization of a-Si:H and a-SiGe:H p-i-n and Schottky Junctions by Admittance Circuit modelling. IEEE Transactions on Electron Devices 39(10) (October 1992)
3. Vieira, M., Vieira, M.A., Louro, P., Fernandes, M., Fantoni, A., Silva, V.: SiC multilayer photonic structures with self optical bias amplification. In: MRS Proceedings, vol. 1426 (2012)
4. Louro, P., Vieira, M., Vieira, M.A., Silva, T.: Mater. Res. Soc. Symp. Proc., vol. 1321 (2011)
5. Vieira, M.A., Vieira, M., Louro, P., Fernandes, M., Costa, J., Garção, A.S.: Mater. Res. Soc. Proc., vol. 1321 (2011)
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