Tolerant Linearity Testing and Locally Testable Codes-Reference-Cited by-同舟云学术

Tolerant Linearity Testing and Locally Testable Codes

Published:2009 Issue: Volume: Page:601-614
ISSN:0302-9743
Container-title:Approximation, Randomization, and Combinatorial Optimization. Algorithms and Techniques
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Author:

Kopparty Swastik,Saraf Shubhangi

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-03685-9_45

Reference21 articles.

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4. Ben-Sasson, E., Sudan, M.: Short PCPs with poly-log rate and query complexity. In: Proceedings of the 37th Annual ACM Symposium on Theory of Computing, pp. 266–275. ACM Press, New York (2005)

5. Ben-Sasson, E., Sudan, M., Vadhan, S., Wigderson, A.: Randomness efficient low-degree tests and short PCPs via ε-biased sets. In: Proceedings of the 35th Annual ACM Symposium on Theory of Computing, pp. 612–621. ACM Press, New York (2003)

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