Analysis of the Reliability of the Protected Memories Affected by Soft Errors
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Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-642-37404-3_22
Reference15 articles.
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3. Zhang Yu, Yang-ming Zheng, Zheng-liang Huang et al (2008) Fault-tolerant design of memory module for pica-satellite on-board computer. J Astronaut 29(6):2057–2061
4. Bajura MA, Boulghassoul Y, Naseer R et al (2007) Models and algorithmic limits for an ECC-based approach to hardening sub-100 nm SRAMs. IEEE Trans Nucl Sci 54(4):935–945
5. Neuberger G, Lima F, Carro L et al (2003) A multiple bit upset tolerant SRAM memory. ACM transactions on design automatic electronic system
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