1. A great many important contributions have come from the application of the tools of surface science for interface research, including those listed below. Here, we emphasize references related to photoemission. Others would include scanning tunneling microscopy, LEED, medium-energy ion scattering, Rutherford backscattering, etc. See, for example: J.M. Poate, K.N. Tu, J.W. Mayer (eds.): Thin Films - Interdiffusion and Reaction (Wiley Interscience, New York 1978)
2. L.C. Feldman, J.W. Mayer (eds.): Fundamentals of Surface and Thin Film Analysis (North- Holland, New York 1986)
3. W.E. Spicer, Z. Liliental-Weber, E. Weber, N. Newman, T. Kendelewicz, R. Cao, C. McCants, P. Mahowald, K. Miyano, I. Lindau: J. Vac. Sci. Technol. B 6, 1245 (1988)
4. NATO Advanced Study Institute, Series B, Physics;WE Spicer,1989
5. Z. Liliental-Weber: J. Vac. Sci. Technol. B 5, 1007 (1987)