A Dynamic Approach to Isolating Erroneous Event Patterns in Concurrent Program Executions-Reference-Cited by-同舟云学术

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A Dynamic Approach to Isolating Erroneous Event Patterns in Concurrent Program Executions

Published:2013 Issue: Volume: Page:97-109
ISSN:0302-9743
Container-title:Multicore Software Engineering, Performance, and Tools
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Author:

Xu Jing,Lei Yu,Carver Richard,Kung David

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-39955-8_9

Reference24 articles.

1. Choi, J., Zeller, A.: Isolating Failure-Inducing Thread Schedules. In: Proceedings of the 2002 ACM SIGSOFT International Symposium on Software Testing and Analysis, pp. 210–220 (July 2002)

2. Park, S., Vuduc, R., Harrold, M.: A Unified Approach for Localizing non-deadlock Concurrency Bugs. In: 2012 IEEE Fifth International Conference on Proceedings of the Software Testing, Verification and Validation (ICST), pp. 51–60 (April 2012)

3. Lu, S., Tucek, J., Qin, F., Zhou, Y.: AVIO: Detecting Atomicity Violations via Access Interleaving Invariants. In: Proceedings of the 12th International Conference on Architectural Support for Programming Languages and Operating Systems, pp. 37–48 (December 2006)

4. Park, S., Lu, S., Zhou, Y.: CTrigger: Exposing Atomicity Violation Bugs from Their Hiding Places. In: Proceedings of ISSTA 2002 Proceedings of the 14th International Conference on Architectural Support for Programming Languages and Operating Systems, pp. 25–36 (March 2009)

5. Park, S., Vuduc, R., Harrold, M.: Falcon: Fault Localization in Concurrent Programs. In: Proceedings of the 32nd ACM/IEEE International Conference on Software Engineering, pp. 245–254 (2010)

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. PFix: fixing concurrency bugs based on memory access patterns;Proceedings of the 33rd ACM/IEEE International Conference on Automated Software Engineering;2018-09-03

2. Using Delta Debugging to Minimize Stress Tests for Concurrent Data Structures;2017 IEEE International Conference on Software Testing, Verification and Validation (ICST);2017-03

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