Detectors for Electron and X-ray Scattering and Imaging Experiments-Reference-Cited by-同舟云学术

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Detectors for Electron and X-ray Scattering and Imaging Experiments

Published:2014 Issue: Volume: Page:207-250
ISSN:0933-033X
Container-title:In-situ Materials Characterization
language:
Short-container-title:

Author:

Ziegler Alexander,Graafsma Heinz

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-45152-2_7

Reference60 articles.

1. C. Ponchut, J. Synchrotron Radiat. 13, 195 (2006)

2. J.D. Dainty, R. Shaw, Image Science (Academic Press, London, 1974)

3. K.H. Herrmann, D. Krahl, Advances in Optical and Electron Microscopy, vol. 9 (Academic Press, London, 1984), p. 1

4. K. Ishizuka, Ultramicroscopy 52, 7 (1993)

5. J.M. Zuo, Ultramicroscopy 66, 21 (1996)

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1. Deformation behavior and amorphization in icosahedral boron-rich ceramics;Progress in Materials Science;2020-07

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