Investigation of local chemical and electronic properties of small particles with EELS point analysis and image energy filtering in a STEM

Author:

Ugarte D.,Colliex C.

Publisher

Springer Berlin Heidelberg

Reference33 articles.

1. Crewe, A.V.: In: Electron microscopy in material science. Valdre, U., Zichichi, A. (eds.), p. 162.New York: Academic Press 1971.

2. Colliex, C, Mory, C: In: Quantitative electron microscopy, Chapman, J.N., Craven, A.J.(eds.), pp. 149-216.Scottish Universities Summer School in Physics 1984.

3. Cowley, J.M.: In: Catalytic materials: relationship between structure and reactivity. Whyte, T.E., Dalla Betta, R.A., Derouane, E.G., Baker, R.T.K. (eds.), pp. 353-366. American Chemical Society Symposium Series n ° 248 1984.

4. Mory, C, Tencé, M., Colliex, C: J. Microsc. Spectrosc. Electron. 10, 381 (1985).

5. Mory, C, Bonnet, N., Colliex, C, Kohl, H., Tencé, M.: In: Image and signal processing in electron microscopy. Scanning Microscopy (Supplement) 2, 329 (1988).

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