Epitaxial Growth of Organic Thin Films and Characterization of their Defect Structures by High-Resolution Electron Microscopy-Reference-Cited by-同舟云学术

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Epitaxial Growth of Organic Thin Films and Characterization of their Defect Structures by High-Resolution Electron Microscopy

Published:1991 Issue: Volume: Page:1-63
ISSN:0172-5076
Container-title:Crystals
language:
Short-container-title:

Author:

Kobayashi Takashi

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-76253-6_1

Reference42 articles.

1. Menter JW (1956) Proc Roy Soc A236: 119

2. Kittel C (1953) Introduction to solid-state physics. Wiley, New York

3. Reimer L (1984) Transmission electron microscopy. Springer, Berlin Heidelberg New York, Tokyo

4. Cowley J (1975) Diffraction physics. North Holland Publ Co, Amsterdam

5. Uyeda N, Kobayashi T, Ishizuka K, Fujiyoshi Y, (1978–79) Chem Scripta 14: 7

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Direct observation of crystal defects in an organic molecular crystals of copper hexachlorophthalocyanine by STEM-EELS;Scientific Reports;2012-02-07

2. Influence of structural variations on high-resolution electron microscopy images of poly[1,6-di(N-carbazolyl)2,4-hexadiyne] nanocrystals;Philosophical Magazine A;2001-07

3. Structure of Organic Thin Films;Macromolecular Science and Engineering;1999

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