Author:
Cui Chuanjin,Wu Haiyun,Zuo Yueming
Publisher
Springer Berlin Heidelberg
Reference7 articles.
1. Xiangjun, Z., Xianggen, Y., Deshu, C.: A novel technique for measuring rounding capacitance and grounding fault resistance in ineffectively grounded systems. Power Engineering Review 21(3), 65–67 (2001)
2. Zeljkol, I., Mark, F.: An interface circuit for measuring capacitance changes based upon capacitance-to-dutycycle (CDC) Converter. IEEE Senors Journal 5(3), 403–410 (2005)
3. Liu, W.-g., Yang, G.-l., Xiao, Q.: Application of Small Capacitance Measuring Techniques in Gravimeter. Journal of Chinese Inertial Technology 13(l), 68–71 (2005) (in Chinese)
4. Inglis, A.D., Wood, B.M., Cote, M., et al.: Direct determination of capacitances tandards using a quadrature bridge and a pair of quantized hall resistors. IEEE Trans. on Instrumentation and Measurement 52(2), 559–562 (2003)
5. Sell, B., Avellan, A., Krautschneider, W.H.: Charge-based capacitance measurements (CBCM)on MOS devices. IEEE Trans. on Device and Materials ReliabiIity 2(1), 9–12 (2002)