Atomic-Level Imaging and Microanalysis of Grain Boundaries in Polycrystalline Semiconductors

Author:

Kazmerski L. L.

Publisher

Springer Berlin Heidelberg

Reference29 articles.

1. Springer Ser,1985

2. H.J. Leamy, G.E. Pike and C.H. Seager, eds.: Grain Boundaries in Semiconductors. Vol. 5 (North-Holland, New York 1982)

3. C.H. Seager, D.J. Sharp, J.K.G. Panitz and J.I. Hanoka: J.Phys. C1 43. 103 (1982)

4. S. Martinuzzi, M.A. Sebbar and J. Gervais: Appl.Phys.Lett. 47, 376 (1985)

5. J.A. Roger, R. Baruch, D. Bernard, J.P. David, J. Guerin, A. Mounguegi and S. Nopurredine: Proc. Sixth Photovoltaic Solar Energy Conf. (D. Reidel Publ. Co., Dordrecht 1986) pp. 98–102.

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1. Grain Boundaries in Semiconductors;Materials Science and Technology;2013-02-15

2. Microstructure and Electrical Properties of Grain Boundaries in Elemental Semiconductors;Springer Proceedings in Physics;1991

3. Atomic Level Studies: Nanoprocessing and Nanocharacterization of Defects in CuInSe2;Tenth E.C. Photovoltaic Solar Energy Conference;1991

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