Thermal Analysis of Semiconductor Devices
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Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-642-48837-5_2.pdf
Reference72 articles.
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3. Sah, C.T.: Characteristics of the Metal-Oxide-Semiconductor Transistors. IEEE Trans. Electron Devices. ED-11, p. 324, 1964.
4. Kennedy, D.P., and O’Brien, R.R.: Computer Aided Two-Dimensional Analysis of the Junction Field-Effect Transistor. IBM Journal of Research and Development, 14, p. 95, 1970.
5. Wada, T., and Frey, J.: Basis of Short-Channel MESFET Operation. IEEE Trans. Electron Devices, ED-26, p. 476, 1979
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