1. Al-Sheiklhly, M.; Christou, A. (1994): How radiation affects polymeric material IEEE Trans. Reliability, vol. 43, no. 4, December, pp. 551–556
2. Båjenescu, T. (1996): Fiabilitatea componentelor electronice. (The reliability of electronic components). Editura Tehnicå, Bucharest, Romania
3. Båjenesco, T. I. (1978): Microcircuits. Reliability, incoming inspection, screening and optimal efficiency. International Conference on Reliability and Maintainability, Paris, June 19–23
4. Båjenesco, T. I. (1981): Problèmes de la fiabilité des composants électroniques actifs actuels. Masson, Paris
5. Båjenescu, T. I. (1984): Zuverlässigkeitsprobleme bei den Halbleiterspeichern and Mikroprozessoren. Elektroniker (Switzerland) no. 9, pp. 25–34; no. 10, pp. 49–57