1. Båjenescu, T. I. (1993): Degradation and reliability problems of optocouplers. Proc. of Annual Semiconductor Conference CAS `93, Sinaia (Romania)
2. Båjenescu, T. I. (1995): CTR degradation and ageing problem of optocouplers. Proc. of the fourth international conference on solid-state and integrated-circuit technology, Beijing (China), October 24–28, 1995, pp. 173–175
3. Båjenescu, T. I. (1996): Fiabilitatea componentelor electronice (Reliability of Electronic Components). Publishing House Editura Tehnicå, Bucharest
4. Båjenescu, T. I. (1985): Zuverlässigkeit elektronischer Komponenten, VDE Verlag, Berlin
5. Newman, D. H.; Ritchie, S. (1981): Reliability and degradation of lasers and LEDs. In:Howes, M. J.; Morgan, D. V. (eds.): Reliability and Degradation. J. Wiley & Sons,Chichester