Normalization of in Situ-Spectra in Thin Layer Chromatography

Author:

Ebel S.,Kang J. S.,Windmann W.

Publisher

Springer Berlin Heidelberg

Reference11 articles.

1. Ebel S, Geitz E, Klarner D (1980) Kontakte (Merck) (1):11–16

2. Kubelka P, Munk F (1931) Z Techn Phys 12:539

3. Draper N, Smith H (1981) Applied Regression Analysis. Wiley & Sons, New York

4. Ebel S, Geitz E, Glaser

5. Huber L, Drouen A (1988) GIT Fachz Laborat (1):16–19

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