Self-heating and Temperature Measurement in Sub-µm-MOSFETs
Author:
Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-642-52314-4_141
Reference2 articles.
1. Sesnic, S.S.; Craig, G.R.: Thermal effects in JFET and MOSFET devices at cryogenic temperatures. IEEE Trans. Electron Devices vol. ED-19, 8 (1972) 933–942
2. Takacs, D.; Trager, J.: Temperature increase by self-heating in VLSI CMOS. ESSDERC 1987, Bologna, pp. 59–62
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