Secondary Ion Mass Spectrometry of Small Molecules Held at Cryogenic Temperatures-Reference-Cited by-同舟云学术

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Secondary Ion Mass Spectrometry of Small Molecules Held at Cryogenic Temperatures

Published:1979 Issue: Volume: Page:292-295
ISSN:0172-6218
Container-title:Springer Series in Chemical Physics
language:
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Author:

Jonkman H. T.,Michl J.

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-61871-0_87

Reference3 articles.

1. A. Benninghoven, CRC Cri t. Rev. Solid State Sc, 291 (1976); Surface Sci., 35, 427 (1973); H. Grade, et al., J. Am. Chenu Soc., 99 7725 (1977).

2. H.T. Jonkman, et al., Anal. Chem., 50 2078 (1978); H.T.Jonkman and J. Michl, Chem. Commun., 751 (1978).

3. G.M. LaCosta, et al., J. Am. Chem. Soc., 101 2951 (1979).

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Experimental Studies on Cluster Ions;Advances in Atomic and Molecular Physics;1985

2. Diagnostics of Clusters in Molecular Beams;Rarefied Gas Dynamics;1985

3. Secondary ion mass spectrometry of small-molecule solids at cryogenic temperatures. IV [1]. Carbon dioxide, carbonyl sulfide and carbon disulfide;International Journal of Mass Spectrometry and Ion Physics;1982-06

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