Heterodyne Common-Path Interference Microscope with a Wavelength-Tunable Diode Source
Author:
Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-642-36359-7_148
Reference11 articles.
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3. Ishii, Y.: Laser-diode interferometry. In: Wolf, E. (ed.) Prog. Opt., vol. 46, pp. 243–309. Elsevier (2004)
4. Suematsu, M., Takeda, M.: Wavelength-shift interferometry for distance measurements using the Fourier transform technique for fringe analysis. Appl. Opt. 30, 4046–4055 (1991)
5. Yoshimura, T., Masazumi, N., Shigematsu, Y.: Imaging a reflecting plate located in scattering media using optical frequency domain reflectometry. Opt. Rev. 4, 227–227 (1997)
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