Improving of Zero Order Fringe Detection in Full-Field Low Coherence Interferometry by Light Source Spectrum Shaping
Author:
Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-642-36359-7_49
Reference8 articles.
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2. Sarac, Z., Dursun, A., Yerdelen, S., Necati Ecevit, F.: Wavelet phase evaluation of white light interferograms. Meas. Sci. Technol. 16, 1878–1882 (2005)
3. Sarac, Z.: Analysis of white-light interferograms by using Stockwell transform. Optics and Lasers in Engineering 46, 823–828 (2008)
4. Ma, J., Bock, W.J.: White-Light Fringe Restoration and High-Precision Central Fringe Tracking Using Frequency Filters and Fourier-Transform Pair. IEEE Transactions on Instrumentation and Measurement 54(5), 2007–2012 (2005)
5. Hirabayashi, A., Ogawa, H., Kitagawa, K.: Fast Surface Profiler by White-Light Interferometry Using a New Algorithm, the SEST Algorithm. In: Optical Manufacturing and Testing IV SPIE, vol. 4451, p. 356 (2001)
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