Technological trends in the area of fullerenes using bibliometric analysis of patents

Author:

Gupta V. K.

Publisher

Springer Science and Business Media LLC

Subject

Library and Information Sciences,Computer Science Applications,General Social Sciences

Reference10 articles.

1. M. M. S. Karki, Bibliometric analysis of patents: implications for R&D and industry, presented at theNational Seminar on Emerging Trends in Scientometrics and Infometrics, February 6–7, 1997, organised by NISTADS, New Delhi.

2. A. F. J. Van Raan, Advanced bibliometric methods to assess research performance and scientific development: basic principles and recent practical applications,Research Evaluation, 3 (3), 1993.

3. H. Grupp, Patents as potential indicators of the utility of EC research programmes,Scientometrics, 21 (3), 1991, 417–445.

4. F. Narin, M. V. Smith, B. M. Albert Jr., What patents tell you about your competition,Chemtech, 1993, 52–59.

5. L. Quoniam, C. Huot, H. Dou, P. Hassanaly, P. Baldit,Bibliometric analysis of patent documents for R&D management, CRRM Fac St Jerome, 13397 Marseille CEDEX 20, France.

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