Particle swarm optimization based RVM classifier for non-linear circuit fault diagnosis
Author:
Publisher
Springer Science and Business Media LLC
Subject
Metals and Alloys,General Engineering
Link
http://link.springer.com/content/pdf/10.1007/s11771-012-1025-2.pdf
Reference18 articles.
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3. HUANG Jiun-lang, CHENG Wang-ting. Test point selection for analog fault diagnosis of unpowered circuit boards [J]. IEEE Transactions on Circuits and Systems-II: Analog and Digital Signal Processing, 2000, 47(10): 977–107.
4. BIPLAB K, SIKDAR, GANGULY N, CHAUDHERI P P. Fault diagnosis of VLSI circuits with cellular automata based pattern classifier [J]. IEEE Transaction Computer-Aided Design Integration Circuits System, 2005, 24(7): 1115–1131.
5. TIPPING M E. Sparse Bayesian learning and the relevance vector machine [J]. Machine Learning Research, 2001, 1(3): 211–344.
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