NAND flash service lifetime estimate with recovery effect and retention time relaxation

Author:

Bu Kai,Chen Yi-ran,Xu Hui,Yi Wei,Xie Qi-you

Publisher

Springer Science and Business Media LLC

Subject

Metals and Alloys,General Engineering

Reference17 articles.

1. GRUPP L M, CAULFIELD A M, COBURN J, SWANSON S, YAAKOBI E, SIEGEL P H, WOLF J K. Characterizing flash memory: Anomalies, observations, and applications [C]// Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture. New York: ACM, 2009: 24–33.

2. JEDEC Solid State Technology Association. JESD218A: JEDEC solid-state drive (SSD) requirements and endurance test method [R]. Arlington: JEDEC, 2011.

3. PABLO A Z. Taking consumer MLC to extreme endurance [R]. Santa Clara: Flash Memory Summit, 2012.

4. DONG Gui-qiang, PAN Yang-yang, XIE N, VARANASI C, ZHANG Tong. Estimating information-theoretical NAND flash memory storage capacity and its implication to memory system design space exploration [J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2012, 20(9): 1705–1714.

5. WANG Chun-dong, WONG Weng-Fai. Extending the lifetime of NAND flash memory by salvaging bad blocks [C]// Proceedings of the Conference on Design, Automation and Test in Europe. San Jose: EDA Consortium, 2012: 260–263.

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