Development of a quantification method for fouling deposits using phosphorescence

Author:

Deponte H.ORCID,Augustin W.,Scholl S.

Abstract

AbstractParticulate fouling on structured surfaces is typically quantified using the integral thermal or mass-based fouling resistance. The observed geometries may be structures that can improve the heat transfer in heat exchangers (e.g., dimples), cavities in components, or more complex geometries. However, due to limited accessibility or the requirement for a locally resolved measurement, the existing quantification methods may not be applicable to structured surfaces. For this reason, a new method is needed for the quantification for fouling deposits. In this study, dimpled surfaces were evaluated by measuring the integral thermal and mass-based fouling resistance and comparing it with the local fouling resistance inside and around the dimple. This comparison was carried out online with the Phosphorescent Fouling Quantification method developed for this purpose, using phosphorescent particles to quantify the deposited mass. The mass-based fouling resistance can be calculated using computer-aided image analysis. The measurements for the evaluation were conducted on dimpled surfaces, which produced a characteristic fouling pattern. With the new method a reduced surface coverage from up to 33.3 % was observed, which led to lower fouling resistances downstream of the dimple compared to a plain surface. These results confirm earlier numerical and experimental findings, suggesting an advantage of dimpled surfaces over other surface structures with respect to thermo-hydraulic efficiency as well as reduced fouling. Thus, the Phosphorescent Fouling Quantification method provides the possibility of calculating values for local fouling resistances on structured surfaces, as well as the possibility of optimizing surface structures to minimize fouling propensity.

Funder

Deutsche Forschungsgemeinschaft

Publisher

Springer Science and Business Media LLC

Subject

Fluid Flow and Transfer Processes,Condensed Matter Physics

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