Temperature compensated, high permittivity dielectric resonators for millimeter wave systems
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation,Radiation
Link
http://link.springer.com/content/pdf/10.1007/BF01014030.pdf
Reference24 articles.
1. G. J. Simonis, ?Index to the literature dealing with the near-millimetric wave properties of materials?, Int. J. of IR and mm waves,3, 429?469, 1982.
2. J. R. Birch and R. N. Clarke, ?Dielectric and optical measurements from 30 to 1000 GHz?, The Radio and Electronic Engineer,52, 565?584, 1982.
3. M. N. Asfar and K. J. Button, preprint on ?Precise millimetre wave measurements of complex refractive index, complex dielectric permittivity and loss tangent of GaAs, Si, SiO2, Al2O3, BeO, macor and glass?. To appear in IEEE Trans. on M.T.T. Feb. 1983.
4. M. R. Stiglitz: ?Dielectric resonators: past, present and futuze?, M.J.,24, 19?36, July 1981.
5. J. K. Plourde and C. L. Ren, ?Application of dielectric resonators in microwave components?, IEEE Trans.MTT29, 754?770, August 1981.
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1. A Temperature-Compensation Technique for Substrate Integrated Waveguide Cavities and Filters;IEEE Transactions on Microwave Theory and Techniques;2012-08
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