LA-ICP-MS analysis of metal layers on samples of cultural heritage-Reference-Cited by-同舟云学术

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LA-ICP-MS analysis of metal layers on samples of cultural heritage

Published:2019-03-25 Issue:12 Volume:73 Page:2923-2936
ISSN:2585-7290
Container-title:Chemical Papers
language:en
Short-container-title:Chem. Pap.

Author:

Vaníčková Elena,Holá Markéta,Rapouch Karel,Pavliňák David,Kopecká Radka,Kanický Viktor

Funder

Ministerstvo Školství, Mládeže a Tělovýchovy

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Industrial and Manufacturing Engineering,General Chemical Engineering,Biochemistry,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s11696-019-00745-6.pdf

Reference38 articles.

1. Arafat A, Na’es M, Kantarelou V, Haddad N, Giakoumaki A, Argyropoulos V, Anglos D, Karydas A (2013) Combined in situ micro-XRF, LIBS and SEM-EDS analysis of base metal and corrosion products for Islamic copper alloyed artefacts from Umm Qais museum, Jordan. J Cult Heritage 14:261–269

2. Bäuerle D (2011) Nanosecond-laser ablation. In: Laser processing and chemistry. Springer, Berlin, pp 237–278

3. Bleiner D, Plotnikov A, Vogt C, Wetzig K, Gunther D (2000) Depth profile analysis of various titanium based coatings on steel and tungsten carbide using laser ablation inductively coupled plasma - “time of flight” mass spectrometry. Fresenius J Anal Chem 368:221–226

4. Cwil M, Konarski P, Ciosek J (2007) Ion mass interferences and matrix effects on SIMS depth profiling of thin Ti/Si multilayer films induced by hydrogen, carbon and oxygen contaminations. Int J Mass Spectrom 263:54–58

5. Eggins SM, Kinsley LPJ, Shelley JMG (1998) Deposition and element fractionation processes during atmospheric pressure laser sampling for analysis by ICP-MS. Appl Surf Sci 127:278–286

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1. Influence of sample surface topography on laser ablation process;Talanta;2021-01

2. Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials;Journal of Analytical Atomic Spectrometry;2020

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