Widely tunable electrooptic pulse-pattern generation and its application to on-wafer large-signal characterization of ultra high-speed electronic devices-Reference-Cited by-同舟云学术

Widely tunable electrooptic pulse-pattern generation and its application to on-wafer large-signal characterization of ultra high-speed electronic devices

Published:1996-07 Issue:7 Volume:28 Page:991-1005
ISSN:0306-8919
Container-title:Optical and Quantum Electronics
language:en
Short-container-title:Opt Quant Electron

Author:

Otsuji T.,Nagatsuma T.,Kato K.,Yoneyama M.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF00820164.pdf

Reference34 articles.

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