Abstract
AbstractMemristive switches are among the most promising building blocks for future neuromorphic computing. These devices are based on a complex interplay of redox reactions on the nanoscale. Nanoionic phenomena enable non-linear and low-power resistance transition in ultra-short programming times. However, when not controlled, the same electrochemical reactions can result in device degradation and instability over time. Two-dimensional barriers have been suggested to precisely manipulate the nanoionic processes. But fabrication-friendly integration of these materials in memristive devices is challenging.Here we report on a novel process for graphene passivation of thin platinum and platinum/copper electrodes. We also studied the level of defects of graphene after deposition of selected oxides that are relevant for memristive switching.
Funder
Deutsche Forschungsgemeinschaft
HORIZON EUROPE European Research Council
Royal Society
Technische Universität Dortmund
Publisher
Springer Science and Business Media LLC
Subject
General Earth and Planetary Sciences,General Physics and Astronomy,General Engineering,General Environmental Science,General Materials Science,General Chemical Engineering
Reference91 articles.
1. Tappertzhofen S (2021) Introduction to non-volatile memory. In: Dimitrakis P, Valov I, Tappertzhofen S (eds) Metal oxides for non-volatile memory. Elsevier, Amsterdam
2. Wouters DJ, Waser R, Wuttig M (2015) Phase-change and redox-based resistive switching memories. Proc IEEE 103(8):1274–1288
3. Linn E, Rosezin R, Tappertzhofen S, Böttger U, Waser R (2012) Beyond von Neumann–logic operations in passive crossbar arrays alongside memory operations. Nanotechnology 23(30):305205
4. Ohno T, Hasegawa T, Tsuruoka T, Terabe K, Gimzewski JK, Aono M (2011) Short-term plasticity and long-term potentiation mimicked in single inorganic synapses. Nat Mater 10(8):591–595
5. Burr GW, Kurdi BN, Scott JC, Lam CH, Gopalakrishnan K, Shenoy RS (2008) Overview of candidate device technologies for storage-class memory. IBM J Res Dev 52(45):449–464