Author:
Wang Xiang,Zhao JianFeng,Wang GaoLei,Wang TianShuo
Abstract
AbstractAs a critical component of the present day power system, a few studies have been conducted on the optimization and future prediction for quality reliability of relay protection devices during their production stage of intelligent testing. Therefore, in this study, a Markov model of multimodal hierarchical spatial states is proposed (1) to calculate the stationary probability and comprehensive availability of different spatial state transfers (2) to predict the quality reliability of the device during production intelligence testing and (3) to infer and calculated the integrated availability of the relay protection device for its future operation during testing. Statistical results from the theoretical findings of this study are highly relevant when compared to the actual operation of relay protection device systems. The correctness of the model calculation method proposed in this study is verified, which provides a feasible method for reliability assessment of relay protection device intelligence tests. In addition, it was also found that the failure rate of the device internal module CPU has a relatively large impact on the comprehensive availability. It is therefore recommended to focus on CPU module detection and timely replacement during the maintenance cycle of on-site operations and maintenance. Finally, the CPU module failure rate threshold for production intelligence testing was amended, which is a valuable indicator for the evolutionary optimization of quality problems in actual smart manufacturing and testing.
Publisher
Springer Science and Business Media LLC
Subject
General Earth and Planetary Sciences,General Physics and Astronomy,General Engineering,General Environmental Science,General Materials Science,General Chemical Engineering
Cited by
2 articles.
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