Amorphous hydrogenated silicon studied by positron lifetime spectroscopy-Reference-Cited by-同舟云学术

Amorphous hydrogenated silicon studied by positron lifetime spectroscopy

Published:1986-07 Issue:3 Volume:40 Page:145-149
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

Schaefer H. -E.,W�rschum R.,Schwarz R.,Slobodin D.,Wagner S.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00617395.pdf

Reference28 articles.

1. 36,1979

2. Japan Annual Reviews in Electronics, Computers and Telecommunications, Vol. 6,1983

3. 12,1979

4. H.E. Schaefer, R. Gugelmeier, M. Schmolz, A. Seeger: InMicrostructural Characterization of Materials by Non-Microscopical Techniques, ed. by N. Hessel Andersen et al. (Riso National Laboratory, Denmark 1984) p. 489

5. W. Weiler, H.E. Schaefer: In [Ref. 4, p. 565]

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