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Barriers to AEM: Contamination and Etching

Published:1986 Issue: Volume: Page:353-374
ISSN:
Container-title:Principles of Analytical Electron Microscopy
language:
Short-container-title:

Author:

Hren J. J.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4899-2037-9_10

Reference73 articles.

1. Ambrose, B. K.; Holland, L.; and Laurenson, L. (1972), J. Micros. 96, 389.

2. Bauer, B., and Speidel, R. (1977), Optik 48, 237.

3. Broers, A. N. (1965), Microelec. & Reliability 4, 103.

4. Burton, E. F.; Sennett, R. S.; and Ellis, S. G. (1947), Nature 160, 565.

5. Calbick, C. J., and Hartman, R. E. (1969), Proc. 27th Annl. EMSA Mtg., Claitot’s Pub. Div., Baton Rouge, p. 82.

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