Asymmetric structure analysis of active surface-sites by in situ polarized total-reflection fluorescence EXAFS-Reference-Cited by-同舟云学术

Asymmetric structure analysis of active surface-sites by in situ polarized total-reflection fluorescence EXAFS

Published:1993 Issue:1-2 Volume:20 Page:117-124
ISSN:1011-372X
Container-title:Catalysis Letters
language:en
Short-container-title:Catal Lett

Author:

Asakura K.,Shirai M.,Iwasawa Y.

Publisher

Springer Science and Business Media LLC

Subject

General Chemistry,Catalysis

Link

http://link.springer.com/content/pdf/10.1007/BF00772603.pdf

Reference9 articles.

1. Y. Iwasawa, K. Asakura, H. Ishii and H. Kuroda, Z. Phys. Chem. NF. 144 (1985) 105;

2. Y. Iwasawa, Adv. Catal. 35 (1987) 87.

3. D.C. Koningsberger and R. Prins, eds.,X-Ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES (Wiley-Intersience, New York, 1988).

4. S.M. Heald, E. Keller and E.A. Stern, Phys. Lett. A 103 (1984) 155.

5. M. Shirai, T. Aruga, K. Asakura, M. Nomura and Y. Iwasawa, to be published.

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