Possibility of contactless measurement of free charge carrier mobility in semiconductors by the uhf resonator method-Reference-Cited by-同舟云学术

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Possibility of contactless measurement of free charge carrier mobility in semiconductors by the uhf resonator method

Published:1985-07 Issue:7 Volume:28 Page:546-549
ISSN:0038-5697
Container-title:Soviet Physics Journal
language:en
Short-container-title:Soviet Physics Journal

Author:

Medvedev Yu. V.,Skryl'nikov A. A.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy,General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF00896180.pdf

Reference9 articles.

1. Yu. K. Pozhela, Plasma and Current Instabilities in Semiconductors [in Russian], Nauka, Moscow (1977).

2. E. M. Gershenzon and V. N. Martsinkevich, Fiz. Tekh. Poluprovodn.,4, No. 3, 542 (1970).

3. Yu. E. Kaigorodov, A. V. Kozlova, and V. A. Presnov, Elektron. Tekh., Ser. 8, No. 3, 87 (1972).

4. N. I. Pavlov and M. P. Basova, Elektron Tekh., Ser. 6, No. 8, 125 (1975).

5. F. Horiguchi, H. Matsumura, S. Furukawa, and H. Ishiwara, Jpn. J. Appl. Phys.,18, 165 (1979).

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